Fault Tolerance Limits and Input Stimulus Selection Using an Implement FPGA-based Testing System
The 11th ENGII Conference(Workshop11 2014)——In this paper, the selection of fault tolerance limits and input stimulus using an implemented adaptive FPGA-based testing system based on a method utilizing wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the advantages of the proposed testing scheme.
关键词： 故障检测 外部测试系统 容错控制 现场可编程门阵列 The 11th ENGII Conference(Workshop11 2014)
主讲人：Prof. Sotirios Pouros 机构：Alexander Technological Educational Institute
时长：0:13:23 年代：2014年
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